[M] Defects in Semiconductors 18 : Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Vols.196-201 Part 4

Creator: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida Contributor: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida Publisher: Trans Tech Publications

• Detail

Periodical:	Materials Science Forum
Series statement:	Defects in Semiconductors (ISSN: 02555476)
Form:	Volume
Language:	English
Physical description:	1563p; 25cm
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Identifier:	ISBN: 9780878497157 ISSN: 02555476
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Item identifier	Library	Shelf	Call number	Circulation status
124218	Sengen	Stack 6	|M|ｷ 929	Available On Shelf Not For Loan