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[M] Defects in Semiconductors 18 : Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Vols.196-201 Part 4
Creator: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida Contributor: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida Publisher: Trans Tech Publications
Periodical: | Materials Science Forum |
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Form: | Volume |
Language: | English |
Physical description: | 1563p; 25cm |
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Identifier: | ISBN: 9780878497157 ISSN: 02555476 |
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Item identifier | Library | Shelf | Call number | Circulation status |
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124218 | Sengen | Journal Archives | |M|キ 929 |
Available On Shelf Not For Loan |