資料の表示
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Know the risk : learning from errors and accidents : safety and risk in today's technology
Romney Beecher Duffey, John Walton Saull
著者: Duffey, Romney Beecher Saull, John Walton 出版者: Butterworth-Heinemann (出版日: 2003)
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言語: | English |
ページ数と大きさ: | xiv, 227 p. ; 24 cm |
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ISBN: 9780750675963
NCID: BA62649575
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Includes bibliographical references (p. 201-210) and index |
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