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[M] Materials, Technology and Reliability for Low-k Dielectrics, and Copper Interconnects - 2006 : Symposium held April 18-21, 2006, San Francisco, California, U.S.A. ; MRS Vol.914 Vol.914 Volume


Creator: Publisher: Materials Research Society (MRS)

Form: Volume Volume
Language: English
Physical description: 462p; 24cm
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Item identifier Library Shelf Call number Circulation status
210818 Sengen Proceedings 26 Picture MRS|P|12328 Available On Shelf