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[M] Defects in Semiconductors ICDS-19 Part 3: Proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997 Part 3 Volume


Creator: Publisher: Trans Tech Publications

Form: Volume Volume
Language: English
Physical description: 1293p; 25cm
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Classification:
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Identifier: ISBN: 9780878497898
Abstract:

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Vols. 258-263 of Materials Science Forum:ISSN 0255-5476

Item identifier Library Shelf Call number Circulation status
211069 Sengen Books 11 Picture 621.315.592|D|キ 1587 Available On Shelf