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Secondary ion mass spectrometry : SIMS II : proceedings of the second international conference, Stanford Univ.,Stanford, California, August 27-31, 1979 Berlin International Conference on Secondary Ion Mass Spectrometry Benninghoven, A. Springer-Verlag (1979) UDC: 543.5 Item identifier Library Shelf Call number Circulation status 215763 Namiki Books 14 543.5|B|T-475 Available On Shelf

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