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152 records found from 103570 records in 0.021 seconds.

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151

Physical Aspects of Electron Microscopy and Microbeam Analysis: Jointly sponsored by the Electron Microscopy Society of America and the Microbeam Analysis Society edited by Benjamin M. Siegel, Donald R. Beaman edited by Benjamin M. Siegel, Donald R. Beaman John Wiley & Sons (1975) UDC: 621.385.833 Item identifier Library Shelf Call number Circulation status 205664 Sengen Books 11 621.385.833|S|5820 Available On Shelf

152

物質の磁性 近角, 聡信 裳華房 (1978-10) Item identifier Library Shelf Call number Circulation status 207743 Sengen Books 4 537.6|C|7639 On Loan ( Due date: May 17, 2024 )

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