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Applications of X-Ray Topographic Methods to Materials Science edited by Sigmund Weissmann, Francoise Balibar, and Jean-Francois Petroff edited by Sigmund Weissmann, Francoise Balibar, and Jean-Francois Petroff Plenum Press UDC: 548.73 Item identifier Library Shelf Call number Circulation status 215670 Sengen Books 9 548.73|W|T-985 Available On Shelf

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