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Properties of porous silicon
Canham, Leigh T. INSPEC (Information service)
edited by Leigh Chanham
INSPEC, Institution of Electrical Engineers
(1997)
UDC: 537.311
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Microcrystalline and nanocrystalline semiconductors--1998 : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A.
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