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1 Bloch wave-based calculation of imaging properties of high-resolution scanning confocal electron microscopy Online resource
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2 Local characterizations of quaternary AlInGaN/GaN heterostructures using TEM and HAADF-STEM Online resource
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3 Quantitative structural analysis of twin boundary in α - Zn7 Sb2 O12 using HAADF STEM method Online resource
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4 Development of Stage-Scanning Type Confocal STEM Online resource
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5 Thickness measurements with electron energy loss spectroscopy Online resource
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6 Interfaces of Xe inclusions ion-implanted in al - Ordering in a fluid xe and matrix oxidation at surfaces Online resource
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7 Development of a stage-scanning system for high-resolution confocal STEM Online resource
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8 A nanosized photodetector fabricated by electron-beam-induced deposition Online resource
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9 Interfaces of Xe inclusions ion-implanted in al - Ordering in a fluid xe and matrix oxidation at surfaces Online resource
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10 Electron beam induced fabrication and characterization of nanostructures Online resource
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