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1	Introduction to analytical electron microscopy Hren, John J. Goldstein, Joseph Joy, David C. Plenum Press (1979) UDC: 537.533.3 Item identifier Library Shelf Call number Circulation status 524741 Namiki Books 9 537.533.||04377 Available On Shelf
2	Principles of analytical electron microscopy Joy, David C. Romig, Alton D. Goldstein, Joseph edited by David C. Joy, Alton D. Romig, Jr. and Joseph I. Goldstein Plenum Press (1986) UDC: 621.385.833 Item identifier Library Shelf Call number Circulation status 215515 Namiki Books 22 621.385.833|J|T-963 Available On Shelf
3	EXAFS spectroscopy, techniques and applications Teo, B. K. Joy, David C. Materials Research Society edited by B.K. Teo, D.C. Joy Plenum Press (1981) UDC: 539 Item identifier Library Shelf Call number Circulation status 215818 Namiki Books 10 539|Ｔ|T-1236 Available On Shelf
4	SEM microcharacterization of semiconductors Holt, D. B. Joy, David C. edited by D.B. Holt, D.C. Joy Academic Press (1989) UDC: 548.73 Item identifier Library Shelf Call number Circulation status 216176 Namiki Books 18 548.73|Ｈ|T-1311 Available On Shelf
5	Microscopy of semiconducting materials, 1981 : proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 6-10 April 1981 Gullis, A. G. Joy, David C. Royal Micoroscopical Society Coference edited by A.G. Cullis, D.C. Joy Institute of Physics (1981) UDC: 537.311 Item identifier Library Shelf Call number Circulation status 207992 Namiki Books 9 537.311|C|7771 Available On Shelf

Total: 5

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