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1 Diffusion and Defect Data Pt A : Defect and Diffusion Forum Serial Volume
ISSN: 16629507
Holding information: 【千現】＜年次:1988-2009＞Vol.57-212,249-286
http://www.scientific.net/DDF
2 Local Lattice Rotations and Dislinations in Microstructures of Distorted Crystalline Materials Vol. 87 Vol.87 Volume
Item identifier Library Shelf Call number Circulation status
219337 Namiki Journal Archives 8 Picture 548.526|D|11790 Available On Shelf
3 Defect Interaction and Clustering in Semiconductors Vols.85-86 Vols.85-86 Volume
Item identifier Library Shelf Call number Circulation status
219336 Namiki Journal Archives 8 Picture 548.526|D|11789 Available On Shelf
4 Beam Injection Assessment of Microstructures in Semiconductors BIAMS 2000: Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 Vols. 78-79 Vols.78-79 Volume
Item identifier Library Shelf Call number Circulation status
218799 Namiki Journal Archives 8 Picture 548.526|D|11471 Available On Shelf
5 Special Defects in Semiconducting Materials Vol.71 Vol.71 Volume
Item identifier Library Shelf Call number Circulation status
218373 Namiki Journal Archives 8 Picture 548.526|D|11107 Available On Shelf
6 Ultra clean processing of silicon surfaces : proceedings of the Fourth International Symposium on ultra clean processing of silicon surfaces held in Ostend, Belgium, September 21-23, 1998 Volume
Item identifier Library Shelf Call number Circulation status
218003 Namiki Journal Archives 8 Picture 548.526|D|10794 Available On Shelf
7 Diffusion and Defect Data Pt．A Vol．113-114 Volume
Item identifier Library Shelf Call number Circulation status
213215 Namiki Journal Archives 8 Picture 548.526|Ｄ| Available On Shelf
8 Diffusion and Defect Data Pt．A Vol．111-112 Volume
Item identifier Library Shelf Call number Circulation status
213214 Namiki Journal Archives 8 Picture 548.526|Ｄ| Available On Shelf
9 Beam injection assessment of defects in semiconductors : proceedings of the 5th workshop on beam injection assessment of defects in semiconductors held in Parkhotel Schloss Wulkow near Berlin, Germany, August 30-September 3, 1998 Volume
Item identifier Library Shelf Call number Circulation status
217984 Namiki Journal Archives 8 Picture 548.526|Ｄ|10776 Available On Shelf
10 Gettering and Defect Engineering in Semiconductor Technology GADEST 2001 : Proceedings of the 9th International Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology, S. Tecla, Italy September 30-October 3, 2001 Vols. 82-84 Vols.82-84 Volume
Item identifier Library Shelf Call number Circulation status
219032 Namiki Journal Archives 8 Picture 548.526|D|11571 Available On Shelf

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