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Beam Injection Assessment of Microstructures in Semiconductors: Biams 2000 Hajime,Tomokage Takashi,Sekiguchi. (2000-01-01) UDC: 621.38 Item identifier Library Shelf Call number Circulation status 602155 Namiki Books 22 621.38|S| Available On Shelf

2

Beam Injection Assessment of Microstructures in Semiconductors BIAMS 2000: Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 Vols. 78-79 Vols.78-79 Editors: Hajime Tomokage, Takashi Sekiguchi Scitec Publications Ltd (2001-01-01) UDC: 548.526 Item identifier Library Shelf Call number Circulation status 218799 Namiki Journal Archives 8 548.526|D|11471 Available On Shelf

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