[M] Symposium on X-ray and electron probe analysis : presented at the Sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963

Creator: American Society for Testing and Materials Publisher: ASTM (Date of publication: 1964)

Manifestation: Symposium on X-ray and electron probe analysis : presented at the Sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963

Shelf: Stack 12 (Sengen)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: STP|A|2854

Register number:

Item identifier: 209694

Include supplements: No

Required role: Guest

Acquired at: April 01, 1965

Note:

Accepted at:

Created at: Wed, 15 Dec 2010 23:15:19 +0900

Updated at: Tue, 23 Dec 2025 15:17:45 +0900