[M] Symposium on X-ray and electron probe analysis : presented at the Sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963

著者: American Society for Testing and Materials 出版者: ASTM (出版日: 1964)

資料: Symposium on X-ray and electron probe analysis : presented at the Sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963

本棚: 書庫12 (千現)

貸出区分: 標準

貸出状態: 在架（利用可能）

請求記号: STP|A|2854

原簿番号:

所蔵情報ID: 209694

付録を含む: いいえ

閲覧に必要な権限: Guest

受入日: 1965年04月01日

業務用メモ:

受入時刻:

作成時刻: 2010/12/15 23:15:19

更新時刻: 2025/12/23 15:17:45