[M] Symposium on X-ray and electron probe analysis : presented at the Sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963

Creator: American Society for Testing and Materials Publisher: ASTM (Date of publication: 1964)

• Detail

Series statement:	ASTM special technical publication No. 349
Form:	Volume
Language:	English
Physical description:	vi, 209 p. ; 24 cm
Subject:
Classification:	UDC: 548.73
Tag:
Identifier:	NCID: BA01667686
Abstract:
Note:

Item identifier	Library	Shelf	Call number	Circulation status
209694	Sengen	Stack 12	STP|A|2854	Available On Shelf Not For Loan