[M] Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963

Creator: Symposium on Advances in electron Metallography American Society for Testing and Materials. Committee E-4 on Metallography Publisher: ASTM (Date of publication: 1964)

Manifestation: Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963

Shelf: Other (Sengen)

Checkout type: 標準

Circulation status: Removed

Call number: STP|A|ｷ483

Register number:

Item identifier: 212750

Include supplements: No

Required role: Guest

Acquired at: December 16, 1992

Note:

Accepted at:

Created at: Wed, 15 Dec 2010 23:20:27 +0900

Updated at: Mon, 12 May 2025 09:55:12 +0900