[M] Beam Injection Assessment of Microstructures in Semiconductors BIAMS 2000: Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 Vols. 78-79 Vols.78-79

Creator: Editors: Hajime Tomokage, Takashi Sekiguchi Publisher: Scitec Publications Ltd (Date of publication: 2001-01-01)

Manifestation: Beam Injection Assessment of Microstructures in Semiconductors BIAMS 2000: Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 Vols. 78-79

Shelf: Journal Archives 8 (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: 548.526|D|11471

Register number:

Item identifier: 218799

Include supplements: No

Required role: Guest

Acquired at: June 05, 2001

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Accepted at:

Created at: Wed, 15 Dec 2010 23:38:04 +0900

Updated at: Mon, 15 Dec 2025 09:52:45 +0900