資料の表示
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Beam Injection Assessment of Microstructures in Semiconductors BIAMS 2000: Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 Vols. 78-79 Vols.78-79 
著者: Editors: Hajime Tomokage, Takashi Sekiguchi 出版者: Scitec Publications Ltd
(出版日: 2001)
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| 巻号: | 巻: Vols.78-79 |
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冊子体
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| 言語: | English |
| ページ数と大きさ: | 441p; 25cm |
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| 識別子: | ISBN: 9783908450610 ISSN: 10120394 |
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