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Secondary ion mass spectrometry : SIMS II : proceedings of the second international conference, Stanford Univ.,Stanford, California, August 27-31, 1979 Berlin
editors: A.Benninghoven...[et al.]
Creator: International Conference on Secondary Ion Mass Spectrometry Benninghoven, A. Publisher: Springer-Verlag (Date of publication: 1979)
Checkout type: 標準
Circulation status: Available On Shelf
Call number: 543.5|B|T-475
Register number:
Item identifier: 215763
Include supplements: No
Required role: Guest
Acquired at: February 14, 1981
Note:
Accepted at:
Created at: Wed, 15 Dec 2010 23:49:54 +0900
Updated at: Mon, 15 Dec 2025 09:36:28 +0900