[M] Physical aspects of electron microscopy and microbeam analysis

edited by Benjamin M. Siegel and D. R. Beaman
Creator: Siegel, Benjamin M. Electron Microscopy Society of America Beaman, Donald Robert Microbeam Analysis Society Contributor: edited by Benjamin M. Siegel, Donald R. Beaman Publisher: Wiley (Date of publication: 1975)

Manifestation: Physical aspects of electron microscopy and microbeam analysis

Shelf: Books 22 (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: 621.385.833|S|5820

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Item identifier: 205664

Include supplements: No

Required role: Guest

Acquired at: December 10, 1976

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Accepted at:

Created at: Wed, 15 Dec 2010 23:51:41 +0900

Updated at: Mon, 15 Dec 2025 09:44:29 +0900