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| 1 |
Microscopy and Microanalysis
 
Microscopy Society of America Microbeam Analysis Society Microscopical Society of Canada
Springer-Verlag
ISSN:
14319276
Holding information: 【並木】＜年次:2008-2008＞Vol.14 |
| 2 |
X-ray spectrometry : XRS
ISSN:
00498246
Holding information: 【並木】＜年次:1980-2007＞Vol.9-36 |
| 3 |
Introduction to analytical electron microscopy
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| 4 |
Physical aspects of electron microscopy and microbeam analysis
Siegel, Benjamin M. Electron Microscopy Society of America Beaman, Donald Robert
edited by Benjamin M. Siegel, Donald R. Beaman
Wiley
(1975)
UDC: 621.385.833
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