[M] Applications of X-ray topographic methods to materials science

edited by Sigmund Weissmann, Françoise Balibar, and Jean-François Petroff
Creator: France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science Weissmann, Sigmund Balibar, Françoise Petroff, Jean-François Centre national de la recherche scientifique National Science Foundation (U.S.) Contributor: edited by Sigmund Weissmann, Francoise Balibar, and Jean-Francois Petroff Publisher: Plenum Press (Date of publication: 1984)

Manifestation: Applications of X-ray topographic methods to materials science

Shelf: Books 18 (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: 548.73|W|T-985

Register number:

Item identifier: 215670

Include supplements: No

Required role: Guest

Acquired at: April 01, 1988

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Accepted at:

Created at: Wed, 15 Dec 2010 23:53:39 +0900

Updated at: Mon, 15 Dec 2025 09:40:16 +0900