[M] Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A.

editors: Qinghuang Lin ... [et al.]
著者: Lin, Qinghuang Materials Research Society. Spring Meeting Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics 出版者: Materials Research Society (出版日: 2007)

資料: Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A.

本棚: 集密書庫60 (並木)

貸出区分: 標準

貸出状態: 在架（利用可能）

請求記号: MRS|P|990

原簿番号:

所蔵情報ID: 211011

付録を含む: いいえ

閲覧に必要な権限: Guest

受入日: 2007年10月23日

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受入時刻:

作成時刻: 2010/12/16 02:32:48

更新時刻: 2025/12/03 16:35:08