[M] Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan

Toru Yoshizawa, Hideshi Yokota, editors ; sponsored by SPIE Japan Chapter ... [et al.] ; published by SPIE--The International Society for Optical Engineering
著者: International Symposium on Polarization Analysis and Applications to Device Technology Yoshizawa, Tōru Yokota, Hideshi Society of Photo-optical Instrumentation Engineers. Japan Chapter Society of Photo-optical Instrumentation Engineers 出版者: SPIE (出版日: 1996)

資料: Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan

本棚: 単行書8 (並木)

貸出区分: 標準

貸出状態: 在架（利用可能）

請求記号: 535.5|Y|ｷ 1599

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所蔵情報ID: 211081

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受入日: 2008年03月05日

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作成時刻: 2010/12/16 02:42:39

更新時刻: 2025/12/15 09:28:53