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Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan International Symposium on Polarization Analysis and Applications to Device Technology Yoshizawa, Tōru Yokota, Hideshi SPIE (1996) UDC: 535.5 Item identifier Library Shelf Call number Circulation status 211081 Namiki Books 8 535.5|Y|ｷ 1599 Available On Shelf

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