資料の表示
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Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan 
Toru Yoshizawa, Hideshi Yokota, editors ; sponsored by SPIE Japan Chapter ... [et al.] ; published by SPIE--The International Society for Optical Engineering
著者: International Symposium on Polarization Analysis and Applications to Device Technology Yoshizawa, Tōru Yokota, Hideshi Society of Photo-optical Instrumentation Engineers. Japan Chapter Society of Photo-optical Instrumentation Engineers 出版者: SPIE
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| 形態: |
冊子体
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| 言語: | English |
| ページ数と大きさ: | xiii, 350 p. ; 28 cm |
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ISBN: 9780819422712
NCID: BC06824243
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| 注記: |
Includes bibliographical references and index |
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