[M] Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 v. 2

edited by K. Sumino
著者: International Conference on the Science and Technology of Defect Control in Semiconductors 角野, 浩二 出版者: North-Holland Distributors for the U.S. and Canada, Elsevier Science Pub. (出版日: 1990)

資料: Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989

本棚: 単行書22 (並木)

貸出区分: 標準

貸出状態: 在架（利用可能）

請求記号: 621.315|S|2

原簿番号: N00119

所蔵情報ID: 600119

付録を含む: いいえ

閲覧に必要な権限: Guest

受入日: 2013年07月01日

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作成時刻: 2013/07/08 13:31:40

更新時刻: 2025/12/15 09:43:45