[M] Development of UHV scanning probe microscope with external stress and　strain application

(Date of publication: 2007)
https://hdl.handle.net/20.500.11932/39058

• Detail

Collection:	NIMS成果物
Form:	Online resource
Language:	English
Physical description:
Subject:	unknown: scanning probe microscopy unknown: scanning probe microscopy unknown: scanning probe microscopy
Classification:
Tag:
Identifier:	Handle URI: https://hdl.handle.net/20.500.11932/39058
Full-text file	NIMS Digital Library Poster presentation (3.61 MB) Poster presentation at IVC-17 in July, 2007. (NIMS only)
Abstract:
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Item identifier	Library	Shelf	Call number	Circulation status
(No number)	Web	Web		Available On Shelf