[M] Correction Factor Tables for Four-Point Probe Resistivity Measurements on Thin, Circular Semiconductor Samples

Creator: Swartzendruber Publisher: National Bureau of Standards (Date of publication: 1964-01-01)

• Detail

Form:	Volume
Language:	English
Physical description:	21p; 28cm
Subject:
Classification:	UDC: 669
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Abstract:
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Item identifier	Library	Shelf	Call number	Circulation status
206354	Namiki	Books 25	669|Ｃｏ|	Available On Shelf Not For Loan