[M] Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan

Toru Yoshizawa, Hideshi Yokota, editors ; sponsored by SPIE Japan Chapter ... [et al.] ; published by SPIE--The International Society for Optical Engineering
Creator: International Symposium on Polarization Analysis and Applications to Device Technology Yoshizawa, Tōru Yokota, Hideshi Society of Photo-optical Instrumentation Engineers. Japan Chapter Society of Photo-optical Instrumentation Engineers Publisher: SPIE (Date of publication: 1996)

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Series statement:	Proceedings / SPIE -- the International Society for Optical Engineering v. 2873
Form:	Volume
Language:	English
Physical description:	xiii, 350 p. ; 28 cm
Subject:
Classification:	UDC: 535.5
Tag:
Identifier:	ISBN: 9780819422712 NCID: BC06824243
Abstract:
Note:	Includes bibliographical references and index

Item identifier	Library	Shelf	Call number	Circulation status
211081	Namiki	Books 8	535.5|Y|ｷ 1599	Available On Shelf

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