資料の表示
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Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A. 
editors: Qinghuang Lin ... [et al.]
著者: Lin, Qinghuang Materials Research Society. Spring Meeting Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics 出版者: Materials Research Society (出版日: 2007)
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冊子体
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| 言語: | English |
| ページ数と大きさ: | xiv, 338 p. ; 24 cm |
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ISBN: 9781558999503
NCID: BA83416338
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| 注記: |
"Symposium B, "Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics," the MRS "interconnect symposium", held April 10-12 at the 2007 MRS Spring Meeting in San Francisco, California ..."--Pref//Includes bibliographical references and indexes |
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