[M] Beam Injection Assessment of Microstructures in Semiconductors BIAMS 2000: Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 Vols. 78-79 Vols.78-79

Creator: Editors: Hajime Tomokage, Takashi Sekiguchi Publisher: Scitec Publications Ltd (Date of publication: 2001)

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Edition:
Number:	Volume number: Vols.78-79
Form:	Volume
Language:	English
Physical description:	441p; 25cm
Subject:
Classification:	UDC: 548.526
Tag:
Identifier:	ISBN: 9783908450610 ISSN: 10120394
Abstract:
Note:

Item identifier	Library	Shelf	Call number	Circulation status
218799	Sengen	Books 9	548.526|D|11471	Available On Shelf

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