[M] Scanning Electron Microscopy/ 1977/ 1 : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and Workshop on Materials and Component Characterization / Quality Control with the SEM/STEM SEM Applications to Semiconductors Analytical Electron Microscopy Biological Specimen Preparation for Sem March 28-April 1, 1977

Creator: edited by Om Johari Contributor: edited by Om Johari Publisher: IIT Research Institute

• Detail

Form:	Volume
Language:	English
Physical description:	784p; 28cm
Subject:
Classification:	UDC: 621.385.833
Tag:
Identifier:	ISBN: 9780915802111
Abstract:
Note:

Item identifier	Library	Shelf	Call number	Circulation status
205654	Sengen	Books 11	621.385.|J|6184	Available On Shelf

• Reserve this manifestation
  (0 users)