資料の表示
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Scanning electron microscopy/1977/I : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and workshops on materials and component characterization/quality control with the SEM/STEM, SEM applications to semiconductors, analytical electron microscopy, biological specimen preparation for SEM, March 28 - April 1, 1977 : Sessions held at McCormick INN, Chicago, Illinois Vol. 1 
edited by Om Johari ; sponsored by IIT research Institute
著者: Scanning Electron Microscope Symposium Johari, Om IIT Research Institute 協力者・編者: edited by Om Johari 出版者: IIT Research Institute (出版日: 1977)
| 代替タイトル: | SEM |
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| 巻号: | 巻: Vol. 1 |
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冊子体
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| 言語: | English |
| ページ数と大きさ: | xvi, 783 p. ; 29 cm |
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ISBN: 9780915802111
NCID: BA22283161
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