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Defects in Semiconductors 18 : Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Vols.196-201 Part 1 
Creator: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida Contributor: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida Publisher: Trans Tech Publications
| Periodical: | Materials Science Forum |
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Volume
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| Language: | English |
| Physical description: | 1p; 25cm |
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| Identifier: | ISBN: 9780878497126 ISSN: 02555476 |
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| Item identifier | Library | Shelf | Call number | Circulation status |
|---|---|---|---|---|
| 124215 | Sengen |
Journal Archives 
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|M|ｷ 926 |
Available On Shelf Not For Loan |