資料の表示
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Defects in Semiconductors 18 : Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 Vols.196-201 Part 1 
著者: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida 協力者・編者: edited by Masashi Suezawa and Hiroshi Katayama-Yoshida 出版者: Trans Tech Publications
| 定期刊行物: | Materials Science Forum |
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| 形態: |
冊子体
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| 言語: | English |
| ページ数と大きさ: | 1p; 25cm |
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| 識別子: | ISBN: 9780878497126 ISSN: 02555476 |
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