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Computer Simulation of Electron Microscope Diffraction and Images 
著者: edited by William Krakow, Michael O'Keefe 協力者・編者: edited by William Krakow, Michael O'Keefe 出版者: TMS ; Minerals, Metals and Materials Society (出版日: 1989)
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| 言語: | English |
| ページ数と大きさ: | 275p; 24cm |
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| 識別子: | ISBN: 9780873391092 |
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| 注記: |
Proceeding of a topical Symposium on Computer Simulation of Electron Microscope Diffraction and Images sponsored by the ASM/MSD Computer Simulation Committee, held at the TMS Annual Meeting in Las Vegas, Nevada, February 28 - March 3, 1989 |
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