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[M] Computer Simulation of Electron Microscope Diffraction and Images Volume


Creator: Contributor: edited by William Krakow, Michael O'Keefe Publisher: TMS ; Minerals, Metals and Materials Society (Date of publication: 1989)

Form: Volume Volume
Language: English
Physical description: 275p; 24cm
Subject:
Classification:
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Identifier: ISBN: 9780873391092
Abstract:

Note:

Proceeding of a topical Symposium on Computer Simulation of Electron Microscope Diffraction and Images sponsored by the ASM/MSD Computer Simulation Committee, held at the TMS Annual Meeting in Las Vegas, Nevada, February 28 - March 3, 1989

Item identifier Library Shelf Call number Circulation status
216419 Sengen Books 13 Picture 669|K|T-1484 Available On Shelf