資料の表示
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Computer simulation of electron microscope diffraction and images : Proceeding of a topical symposium on Computer Simulation of Electron Microscope Diffraction and Images 
sponsored by the ASM/MSD Computer Simulation Committee, held at the TMS Annual Meeting in Las Vegas, Nevada, February 28 - March 3, 1989 ; edited by William Krakow, Michael O'Keefe
著者: Krakow, William O'Keefe, Michael (Michael A.) ASM/MSD Computer Simulation Committee Minerals, Metals and Materials Society. Meeting 協力者・編者: edited by William Krakow, Michael O'Keefe 出版者: Minerals, Metals and Materials Society (出版日: 1989)
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| 言語: | English |
| ページ数と大きさ: | viii, 275 p. ; 24 cm |
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ISBN: 9780873391092
NCID: BA10875298
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