資料の表示
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X-ray microscopy and X-ray microanalysis : proceedings of the Second International Symposium (Stockholm, 1960) 
edited by A. Engström, V. Cosslett, H. Pattee
著者: International Symposium on X-ray Optics and X-ray Microanalysis Engström, Arne Cosslett, V. Pattee, H. 協力者・編者: edited by A. Engstrom, V. Cosslett, H. Pattee 出版者: Elsevier
| 代替タイトル: | X-Ray microscopy and microanalysis |
| 形態: |
冊子体
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| 言語: | English |
| ページ数と大きさ: | x, 542 p. ; 25 cm |
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| 識別子: |
NCID: BA06274556
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| 注記: |
Papers in English, German, or French//Includes bibliographies |
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