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X-ray microscopy and X-ray microanalysis : proceedings of the Second International Symposium (Stockholm, 1960) International Symposium on X-ray Optics and X-ray Microanalysis Engström, Arne Cosslett, V. edited by A. Engstrom, V. Cosslett, H. Pattee Elsevier (1960) UDC: 539.26 Item identifier Library Shelf Call number Circulation status 202092 Namiki Books 11 539.26|E|1765 Available On Shelf

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