資料の表示
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Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A. 
editors, Michael Mastro ... [et al.]
著者: Mastro, Michael Materials Research Society. Meeting 出版者: Materials Research Society (出版日: 2009)
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| 形態: |
冊子体
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| 言語: | English |
| ページ数と大きさ: | xiii, 259 p. ; 24 cm |
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ISBN: 9781605110806
NCID: BA90769473
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| 注記: |
Includes bibliographical references and indexes |
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