[M] Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963

Creator: Symposium on Advances in electron Metallography American Society for Testing and Materials. Committee E-4 on Metallography Publisher: ASTM (Date of publication: 1964)

Manifestation: Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963

Shelf: Stack 12 (Sengen)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: STP|A|1607

Register number:

Item identifier: 202064

Include supplements: No

Required role: Guest

Acquired at: August 09, 1967

Note:

Accepted at:

Created at: Wed, 15 Dec 2010 22:47:54 +0900

Updated at: Tue, 23 Dec 2025 15:15:39 +0900