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Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963 
Creator: Symposium on Advances in electron Metallography American Society for Testing and Materials. Committee E-4 on Metallography Publisher: ASTM (Date of publication: 1964)
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Volume
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| Language: | English |
| Physical description: | vi, 89 p. ; 23 cm |
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NCID: BA04549493
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"Sponsored by Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Metallography."//This is v.5 of "ASTM advances in electron metallography series" (data based on Advances in electron metallography, v.6, 1966) |
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