[M] Correction Factor Tables for Four-Point Probe Resistivity Measurements on Thin, Circular Semiconductor Samples

Creator: Swartzendruber Publisher: National Bureau of Standards (Date of publication: 1964-01-01)

Manifestation: Correction Factor Tables for Four-Point Probe Resistivity Measurements on Thin, Circular Semiconductor Samples

Shelf: Books 25 (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: 669|Ｃｏ|

Register number:

Item identifier: 206354

Include supplements: No

Required role: Guest

Acquired at: December 12, 1970

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Accepted at:

Created at: Wed, 15 Dec 2010 23:08:40 +0900

Updated at: Mon, 15 Dec 2025 09:48:27 +0900