[M] Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963

著者: Symposium on Advances in electron Metallography American Society for Testing and Materials. Committee E-4 on Metallography 出版者: ASTM (出版日: 1964)

資料: Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963

本棚: その他 (千現)

貸出区分: 標準

貸出状態: 除籍済み

請求記号: STP|A|ｷ483

原簿番号:

所蔵情報ID: 212750

付録を含む: いいえ

閲覧に必要な権限: Guest

受入日: 1992年12月16日

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受入時刻:

作成時刻: 2010/12/15 23:20:27

更新時刻: 2025/05/12 09:55:12