[M] Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan

Toru Yoshizawa, Hideshi Yokota, editors ; sponsored by SPIE Japan Chapter ... [et al.] ; published by SPIE--The International Society for Optical Engineering
Creator: International Symposium on Polarization Analysis and Applications to Device Technology Yoshizawa, Tōru Yokota, Hideshi Society of Photo-optical Instrumentation Engineers. Japan Chapter Society of Photo-optical Instrumentation Engineers Publisher: SPIE (Date of publication: 1996)

Manifestation: Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan

Shelf: Books 8 (Namiki)

Checkout type: 標準

Circulation status: Available On Shelf

Call number: 535.5|Y|ｷ 1599

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Item identifier: 211081

Include supplements: No

Required role: Guest

Acquired at: March 05, 2008

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Created at: Thu, 16 Dec 2010 02:42:39 +0900

Updated at: Mon, 15 Dec 2025 09:28:53 +0900