資料の表示
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Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963 
著者: Symposium on Advances in electron Metallography American Society for Testing and Materials. Committee E-4 on Metallography 出版者: ASTM (出版日: 1964)
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冊子体
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| 言語: | English |
| ページ数と大きさ: | vi, 89 p. ; 23 cm |
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| 識別子: |
NCID: BA04549493
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| 注記: |
"Sponsored by Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Metallography."//This is v.5 of "ASTM advances in electron metallography series" (data based on Advances in electron metallography, v.6, 1966) |
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