資料の表示
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Advances in electron metallography, vol. 6 : a symposium presented at the Sixty-eighth Annual Meeting, American Society for Testing and Materials, Lafayette, Ind., June 13-18, 1965 
著者: American Society for Testing and Materials. Committee E-4 on Metallography Symposium on Advances in electron Metallography 出版者: ASTM (出版日: 1966)
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| 形態: |
冊子体
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| 言語: | English |
| ページ数と大きさ: | 131 p. ; 23 cm |
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| 識別子: |
NCID: BA20544548
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| 注記: |
"sponsored by Subcommittee XI (Electron Microscopy, Diffraction, and Microprobe Analysis) of Committee E-4 on Metallography." |
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