[M] Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 pt. 3

edited by Masashi Suezawa and Hiroshi Katayama-Yoshida
Creator: International Conference on Defects in Semiconductors Suezawa, Masashi Katayama-Yoshida, Hiroshi Contributor: edited by; Masashi Suezawa and Hiroshi Katayama-Yoshida Publisher: Trans Tech Publications (Date of publication: 1995)

• Detail

Titlte alternative:	Defects in semiconductors 18
Series statement:	Materials science forum v. 196-201
Edition:
Number:	Volume number: pt. 3
Form:	Volume
Language:	English
Physical description:	1 v. ; 25 cm
Subject:
Classification:	UDC: 621.315.592
Tag:
Identifier:	ISBN: 9780878497140 NCID: BA27177886
Abstract:
Note:

Item identifier	Library	Shelf	Call number	Circulation status
219285	Namiki	Books 22	621.315.|D|ｷ1199	Available On Shelf

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